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Volumn 55, Issue 21, 1997, Pages 14429-14433

Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope

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EID: 0001692536     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.14429     Document Type: Article
Times cited : (26)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.