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Physical Review B - Condensed Matter and Materials Physics

Volumn 55, Issue 17, 1997, Pages 11422-11431

Thickness dependence of the total magnetic moment per atom in the Cu/Ni/Cu/Si(001) system

(11) Hope, S a Lee, J a Rosenbusch, P a Lauhoff, G a Bland, J A C a Ercole, A a Bucknall, D b Penfold, J b Lauter, H J b Lauter, V b Cubitt, R b

a UNIVERSITY OF CAMBRIDGE (United Kingdom)

b RUTHERFORD APPLETON LABORATORY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000221744 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.55.11422 Document Type: Article

Times cited : (55)

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