Roughness fractal approach of oxidized surfaces by AFM and diffuse X-ray reflectometry measurements

Applied Surface Science

Volumn 171, Issue 3-4, 2001, Pages 189-196

  Arnault, J C ^a   Knoll, A ^b   Smigiel, E ^b   Cornet, A ^b  

^a Inst Phys Chim Strasbourg I   (France)

^b INSA DE STRASBOURG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRACTALS; OXIDATION; REFLECTOMETERS;

DIFFUSE X-RAY REFLECTOMETRY;

SURFACE ROUGHNESS;

EID: 0035252221     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00550-X     Document Type: Article

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