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Volumn 92, Issue 1, 2007, Pages 1-14

A system view of the No Fault Found (NFF) phenomenon

Author keywords

Availability performance factors; Causes; Consequences; Improvement management; No Fault Found (NFF); Stakeholders

Indexed keywords

LIFE CYCLE; PERFORMANCE; PROBLEM SOLVING; SECURITY SYSTEMS;

EID: 33748329462     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ress.2005.11.004     Document Type: Review
Times cited : (87)

References (46)
  • 1
    • 33748310327 scopus 로고    scopus 로고
    • note
    • **This reference has not been encountered by the performed literature search.
  • 2
    • 33748287878 scopus 로고    scopus 로고
    • note
    • *
  • 3
    • 33748312847 scopus 로고    scopus 로고
    • Beniaminy I, Joseph D. Reducing the 'no fault found' problem: contributions from expert-system methods. In: IEEE aerospace conference, proceedings, 2002, Big Sky, MT, USA. p. 6-2971-6-2973.
  • 4
    • 0036540125 scopus 로고    scopus 로고
    • The 'trouble not identified' phenomenon in automotive electronics
    • Thomas D.A., Ayers K., and Pecht M. The 'trouble not identified' phenomenon in automotive electronics. Microelectron Reliab 42 4-5 (2002) 641-651
    • (2002) Microelectron Reliab , vol.42 , Issue.4-5 , pp. 641-651
    • Thomas, D.A.1    Ayers, K.2    Pecht, M.3
  • 5
    • 0037260859 scopus 로고    scopus 로고
    • Baskoro G, Rouvroye JL, Bacher W, Brombacher AC. Developing MESA: an accelerated reliability test. In: Proceedings of annual reliability and maintainability symposium (RAMS 2003), 2003, Tampa, FL, USA. p. 303-8.
  • 6
    • 0032304832 scopus 로고    scopus 로고
    • Sudolsky MD. The fault recording and reporting method. In: AUTOTESTCON proceedings, 1998, Salt Lake City, UT, USA. p. 429-37.
  • 7
    • 0037256028 scopus 로고    scopus 로고
    • James I, Lumbard D, Willis I, Goble J. Investigating No Fault Found in the aerospace industry. In: Proceedings of annual reliability and maintainability symposium (RAMS 2003), 2003, Tampa, FL, USA. p. 441-6.
  • 8
    • 0033348415 scopus 로고    scopus 로고
    • Lee L, Andrews J. Satellite hierarchical system test using IEEE 1149.1-based COTS test tools: a case history with results and lessons. In: AUTOTESTCON proceedings, 1999, San Antonio, TX, USA. p. 193-201.
  • 9
    • 0036446376 scopus 로고    scopus 로고
    • Steadman B, Pombo T, Shively J, Kirkland L. Reducing No Fault Found using statistical processing and an expert system. In: AUTOTESTCON proceedings, 2002, Huntsville, AL, USA. p. 872-9.
  • 11
    • 0035466288 scopus 로고    scopus 로고
    • Investigation of the occurrence of no-faults-found in electronics
    • Jones J., and Hayes J. Investigation of the occurrence of no-faults-found in electronics. IEEE Trans Reliab 50 3 (2001) 289-292
    • (2001) IEEE Trans Reliab , vol.50 , Issue.3 , pp. 289-292
    • Jones, J.1    Hayes, J.2
  • 12
    • 0018285607 scopus 로고    scopus 로고
    • Turner DB. Reliability improvement of BART vehicle train control. In: Proceedings of the 29th IEEE vehicular technology conference, 1979, Arlington Heights, IL, USA. p. 279-88.
  • 13
    • 33748321912 scopus 로고    scopus 로고
    • Stauffer WH. Reducing DOA PCBs in a repair depot. In: Proceedings of TEST 1988, 1988, Boston, MA, USA. p. 609.
  • 14
    • 0032298491 scopus 로고    scopus 로고
    • Zavatto DM, Gibson J, Talbot M. C-17 portable advanced diagnostic system. In: AUTOTESTCON proceedings, 1998, Salt Lake City, UT, USA. p. 536-41.
  • 15
    • 0036049305 scopus 로고    scopus 로고
    • Burns DJ, Cluff KD, Karimi K, Hrehov DW. A novel power quality monitor for commercial airplanes. In: Conf Rec IEEE Instrum Meas Technol Conf., 2002, Anchorage, AK, USA. p. 1649-53.
  • 16
    • 0030407552 scopus 로고    scopus 로고
    • Patel VC, Kadirkamanathan V, Thompson HA. A novel self-learning fault detection system for gas turbine engines. In: IEE Conf Publ. UK: Exeter; 1996. p. 867-72.
  • 17
    • 0037249730 scopus 로고    scopus 로고
    • Can you clean a no-clean assembly?
    • Munson T. Can you clean a no-clean assembly?. Circ Assem 14 1 (2003) 48
    • (2003) Circ Assem , vol.14 , Issue.1 , pp. 48
    • Munson, T.1
  • 19
    • 33748325444 scopus 로고    scopus 로고
    • Stennet NA, Hayes JA. Connector reliability-analysis of current field failure data. In: Proceedings of the 16th international conference on electrical contacts (ICEC '92), 1992, Loughborough, UK. p. 23-8.
  • 20
    • 33748334874 scopus 로고    scopus 로고
    • Stennet NA, Hayes JA. Connector reliability: a 'no fault found problem'? In: Proceedings of the 7th European passive components symposium (CARTS-Europe '93), 1993, Geneva, Switzerland. p. 158-64.
  • 21
    • 0032308290 scopus 로고    scopus 로고
    • Davidson S. ASIC jeopardy-diagnosing without a FAB. In: IEEE international test conference TC, 1998, Washington, DC, USA. p. 1136.
  • 22
    • 0033280080 scopus 로고    scopus 로고
    • Tsai AC-S, Tong C-C, Oh L-E. Sensor data correction with neural network incorporating fuzzy logic. In: IEEE international conference on fuzzy systems, 1999, Seoul, South Korea. p. I-66-I-71.
  • 24
    • 6344255039 scopus 로고    scopus 로고
    • Learning the lessons from in-service rejection
    • James I. Learning the lessons from in-service rejection. IEE Colloq Dig n189 (1999) 21-24
    • (1999) IEE Colloq Dig , vol.n189 , pp. 21-24
    • James, I.1
  • 25
    • 0036443163 scopus 로고    scopus 로고
    • Berk K, Fitzgibbon K, Wilson N, Barker R, Howell C. Test station configuration and health management. In: AUTOTESTCON Proceedings, 2002, Huntsville, AL, USA. p. 2-10.
  • 26
    • 0031144560 scopus 로고    scopus 로고
    • Delta Air Lines updates static control in avionics repair
    • Story M., and Sipe P. Delta Air Lines updates static control in avionics repair. EE Eval Engin 36 5 (1997) 4
    • (1997) EE Eval Engin , vol.36 , Issue.5 , pp. 4
    • Story, M.1    Sipe, P.2
  • 27
    • 3142767725 scopus 로고    scopus 로고
    • Eberle H, Wander A, Gura N. Testing systems wirelessly. In: Proceedings of the IEEE VLSI test symposium, 2004, Napa Valley, CA, USA. p. 335-40.
  • 28
    • 0032298352 scopus 로고    scopus 로고
    • Scully JK. The hidden crisis in test effectiveness. In: AUTOTESTCON Proceedings, 1998, Salt Lake City, UT, USA. p. 59-66.
  • 29
    • 33748312843 scopus 로고
    • No-fault-found PCBs: if it ain't broke, don't swap it
    • 61
    • McCullough B. No-fault-found PCBs: if it ain't broke, don't swap it. Electron Test 11 5 (1988) 57-58 61
    • (1988) Electron Test , vol.11 , Issue.5 , pp. 57-58
    • McCullough, B.1
  • 30
    • 85072477290 scopus 로고    scopus 로고
    • Austin JW, Weimer RJ. Service and support of electronic products in the trucking industry. In: SAE Technical Papers Series, 1987, Seattle, WA, USA
  • 31
    • 84879379235 scopus 로고    scopus 로고
    • Fitzgibbon KT, Kirkland LV, Steadman B, Pombo T. A test station health monitoring system [military aircraft]. In: IEEE aerospace conference proceedings, 2002, Big Sky, MT, USA. p. 6-3161-6-3166.
  • 32
    • 33748308515 scopus 로고    scopus 로고
    • Don't fail good boards
    • 60, 62
    • Turner T.T. Don't fail good boards. Test Meas World 17 4 (1997) 57-58 60, 62
    • (1997) Test Meas World , vol.17 , Issue.4 , pp. 57-58
    • Turner, T.T.1
  • 33
    • 0020878466 scopus 로고    scopus 로고
    • Morrison TH. Improved test strategies for feedback circuits. In: AUTOTESTCON proceedings, 1983, Fort Worth, TX, USA. p. 217-21.
  • 34
    • 0024930648 scopus 로고    scopus 로고
    • Johnson SG. Continuous vendor improvement: a proven approach. In: Annu Qual Congr Trans., 1989, Toronto, Ont., Canada. p. 10-13.
  • 35
    • 0029695988 scopus 로고    scopus 로고
    • Anderson D. When is an NTF (no trouble found) an NFT (not enough functional test)?. In: Natl Electron Packag Prod Conf Proc Tech Program, 1996, Boston, MA, USA. p. 205-10.
  • 36
    • 0142153835 scopus 로고    scopus 로고
    • Berk K, Flann N, Howell C, Wille K. Semi-automatic development of test program sets (TPS). In: AUTOTESTCON proceedings, 2003, Anaheim, CA, USA. p. 217-25.
  • 37
    • 0025723768 scopus 로고    scopus 로고
    • Ritchie P. Modelling and monitoring the decay of equipment reliability. In: Proceedings of Annual Reliability and Maintainability Symposium (RAMS 1991), 1991, Orlando, FL, USA. p. 312-6.
  • 38
    • 2442589875 scopus 로고    scopus 로고
    • More than a bit of help needed in remote operations
    • Lyon B. More than a bit of help needed in remote operations. Electron Prod Des 25 4 (2004) 19-22
    • (2004) Electron Prod Des , vol.25 , Issue.4 , pp. 19-22
    • Lyon, B.1
  • 39
    • 33748291187 scopus 로고    scopus 로고
    • Lea Jones J, Radford M, Shepherd, B. An IMA packaging design for improved reliability and reduced instances of NFF. In: Proceedings of Avionics Conference, 1998, London, UK. p. 11.
  • 40
    • 33748298580 scopus 로고    scopus 로고
    • James IJ. A systems approach to in-service rejection management. In: Proceedings of avionics conference and exhibition, 1999, London, UK. p. 7.2.1-7.2.11.
  • 41
    • 0029728726 scopus 로고    scopus 로고
    • Sudolsky MD. C-17 O-level fault detection isolation bit improvement concepts. In: AUTOTESTCON Proceedings, 1996, Dayton, OH, USA. p. 361-8.
  • 42
    • 33748329204 scopus 로고    scopus 로고
    • Marriot S, Harrison RF. The reduction of no fault found incidents using weighted posterior knowledge integration. In: Proceedings of fault detection, supervision and safety for technical processes (SAFEPROCESS 2000), 2000, Budapest, Hungary. p. 495-8.
  • 43
    • 33748319133 scopus 로고    scopus 로고
    • Gordon OC. Dead-on-arrival and no-trouble found parts-gremlins in your pipelines. In: Proceedings of TEST 1988, 1988, Boston, MA, USA. p. 603-8.
  • 44
    • 2442643817 scopus 로고    scopus 로고
    • Continuous improvements of complex technical systems: a theoretical quality management framework supported by requirements management and health management
    • *
    • *
    • (2004) Total Qual Manage Business Excellence , vol.15 , Issue.4 , pp. 511-525
    • Söderholm, P.1
  • 45
    • 33748329203 scopus 로고
    • Service quality and cost approaches to manage a multi supplier digital telecommunications network
    • ****This reference has been encountered by the performed literatures search, but has not been used.
    • ****This reference has been encountered by the performed literatures search, but has not been used.
    • (1992) Proceedings of international switching symposium, Yokohama, Japan , pp. 138-142
    • Luby, J.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.