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Volumn , Issue , 1998, Pages 1136-
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ASIC jeopardy - diagnosing without a fab
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Author keywords
[No Author keywords available]
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Indexed keywords
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
DESIGN FOR TESTABILITY;
FAILURE ANALYSIS;
PROBLEM SOLVING;
QUALITY ASSURANCE;
NO TROUBLE FOUND (NTF) DIAGNOSIS;
INTEGRATED CIRCUIT TESTING;
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EID: 0032308290
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (1)
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References (0)
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