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Volumn , Issue , 1996, Pages 361-368
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C-17 O-level fault detection isolation bit improvement concepts
a
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Author keywords
[No Author keywords available]
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Indexed keywords
AUTOMATIC TESTING;
DATA ACQUISITION;
DATA HANDLING;
ELECTRIC FAULT LOCATION;
ELECTRONIC EQUIPMENT TESTING;
EXPERT SYSTEMS;
MILITARY APPLICATIONS;
BUILT IN TEST (BIT);
ZERO LEVEL FAULT DETECTION;
AVIONICS;
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EID: 0029728726
PISSN: 07347510
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (4)
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References (13)
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