Hidden crisis in test effectiveness

AUTOTESTCON (Proceedings)

Volumn , Issue , 1998, Pages 59-66

  Scully, John K ^a  

^a JKS Systems   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVIONICS; BUILT-IN SELF TEST; FAULT TREE ANALYSIS; MAINTENANCE;

FAULT DETECTION; FAULT ISOLATION; TEST EFFECTIVENESS;

ELECTRONIC EQUIPMENT TESTING;

EID: 0032298352     PISSN: 07347510     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)