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Volumn , Issue , 1983, Pages 217-221
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IMPROVED TEST STRATEGIES FOR FEEDBACK CIRCUITS.
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
FAULT ISOLATION;
FEEDBACK CIRCUITS;
MILITARY AIRCRAFT ELECTRONICS;
PERFORMANCE VERIFICATION;
TEST STRATEGIES;
TESTABILITY;
ELECTRONIC CIRCUITS;
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EID: 0020878466
PISSN: 07347510
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (1)
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References (0)
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