Investigation of the occurrence of: No-faults-found in electronic equipment

IEEE Transactions on Reliability

Volumn 50, Issue 3, 2001, Pages 289-292

  Jones, Jeff ^a,b   Hayes, Joe ^c  

^a IEEE   (United Kingdom)

^b UNIVERSITY OF WARWICK   (United Kingdom)

^c LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

Field failure database; No fault found; Reliability analysis of systems

Indexed keywords

FIELD-FAILURE DATABASE; NO FAULT FOUND FAILURE;

DATABASE SYSTEMS; DIGITAL INTEGRATED CIRCUITS; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; PRINTED CIRCUIT BOARDS;

RELIABILITY THEORY;

EID: 0035466288     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.974126     Document Type: Article

References (1)

1. The organization of a study of the field failure of electronic components