Elastic constants and X-ray stress measurement of cubic thin films with fiber texture

JSME International Journal, Series A: Mechanics and Material Engineering

Volumn 42, Issue 2, 1999, Pages 224-234

  Tanaka, Keisuke ^a   Akiniwa, Yoshiaki ^a   Ito, Toshimasa ^a   Inoue, Kaoru ^b  

^a NAGOYA UNIVERSITY   (Japan)

^b TOSHIBA CORPORATION   (Japan)

Author keywords

Experimental Stress Analysis; Fiber Texture; Micromechanics; Residual Stress; Reuss Model; Thin Films; Voigt Model; X ray Stress Measurement

Indexed keywords

COMPOSITE MICROMECHANICS; ELASTIC MODULI; MATHEMATICAL MODELS; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; TEXTURES; THIN FILMS; X RAY CRYSTALLOGRAPHY;

REUSS MODEL; VOIGT MODEL; X RAY STRESS MEASUREMENT;

STRESS ANALYSIS;

EID: 0032623596     PISSN: 13408046     EISSN: None     Source Type: Journal    
DOI: 10.1299/jsmea.42.224     Document Type: Article

References (18)

1. Marty, B., Ji. V., Gergaud, P. and Lebrun, J.L., private communication (1995).
2. Korhonen, M.A. and Paszkiet, C.A., Scripta Met., Vol. 23 (1989), p. 1449.
3. Baron, H.U. and Hauk, V., Z. Metallkde, Vol. 79, No. 2 (1988), p. 127.
4. Zaouali, M., Lebrun, J.L. and Gergaud, P., Surface and Coating Technology, Vol. 50 (1991), p. 5.
5. Uchiyama, Y., Hasaka, M., Mori, H. and Matsutaka, H., Hyomenshori, (in Japanese), Vol. 42, No. 2 (1991), p. 1250.
6. Matsue, T., Hanabusa, T. and Ikeuchi, Y., J. Soc. Mat. Sci., Jpn., (in Japanese), Vol. 45, No. 10 (1996), p. 1119.
7. Sundgren, J.-E., Thin Solid Films, Vol.128 (1985), p. 21.
8. Ejiri, S., Lin, Z., Sasaki, T. and Hirose, Y., J. Soc. Mat. Sci., Jpn., (in Japanese), Vol. 46, No. 7 (1997), p. 750.
9. Miki, Y., Araki, H., Tamaguchi, T., Nishibata, Y. and Yakushiji, M., J. Soc. Mat. Sci. Jpn., (in Japanese), Vol. 46, No. 8 (1997), p. 933.
10. Tanaka, K., Ishihara, K. and Inoue, K., J. Soc. Mat. Sci. Jpn., (in Japanese), Vol. 45, No. 8 (1996), p. 945.
11. Tanaka, K., Ishihara, K. and Akiniwa, Y., Adv. X-Ray Analysis, Vol. 39 (1997), p. 267.
12. Tanaka, K., Akiniwa, Y., Inoue, K. and Ohta, H., JSME Int. J., Ser. A, Vol. 41, No. 2 (1998), p. 290.
13. Reuss, A. and Angew, Z. Math. Mech., Vol. 9 (1929), p. 49.
14. Voigt, W., Lehrbuch der Kristallphsik, (1978), p. 962, Leipzig, Teubner.
15. Nye, J.F., Physical Properties of Crystals, (1957), p. 141, Oxford Science Publication.
16. Kamm, G.N. and Alers, G.A., J. Appl. Phys., Vol. 35 (1964), p. 327.
17. Segmuller, A. and Murakami, M., Treatise Mater. Sci. Tech., Vol. 27 (1988), p. 143.
18. Perry, A.J., Thin Solid Films, Vol. 170 (1989), p. 63.