Investigation on microstructure and optical properties of titanium dioxide coatings annealed at various temperature

Optical Materials

Volumn 28, Issue 8-9, 2006, Pages 1058-1063

  Tian, Guanglei ^a,b   Dong, Lei ^a,b   Wei, Chaoyang ^a,b   Huang, Jainbing ^a,b   He, Hongbo ^a   Shao, Jianda ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

AFM; Annealing; Coatings; Optical loss; Titanium dioxide

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; COATINGS; ELECTRON ABSORPTION; MICROSTRUCTURE; OPTICAL PROPERTIES; TEMPERATURE DISTRIBUTION; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON BEAM EVAPORATION DEPOSITION; GRAIN SIZE; OPTICAL LOSS; ULTRAVIOLET BAND;

TITANIUM DIOXIDE;

EID: 33747891991     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2005.06.007     Document Type: Article

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