Structural analysis of Si(1 1 1)-√21 × √21-Ag surface by reflection high-energy positron diffraction

Surface Science

Volumn 600, Issue 16, 2006, Pages 3141-3146

  Fukaya, Y ^a   Kawasuso, A ^a   Ichimiya, A ^a,b  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b JAPAN WOMEN'S UNIVERSITY   (Japan)

Author keywords

Reflection high energy positron diffraction (RHEPD); Silicon; Silver; Surface structure; Total reflection

Indexed keywords

ADSORPTION; DIFFRACTION; POSITRONS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SILVER; STRUCTURAL ANALYSIS; SURFACE STRUCTURE;

DYNAMICAL DIFFRACTION THEORY; PATTERN ANALYSES; TOTAL REFLECTION;

SILICON;

EID: 33747784587     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.05.045     Document Type: Article

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