Interface reconstructed structure of Ag/Si(1 1 1) revealed by X-ray diffraction

Surface Science

Volumn 493, Issue 1-3, 2001, Pages 194-199

  Horii, S ^a   Akimoto, K ^a   Ito, S ^a,b,c   Emoto, T ^a   Ichimiya, A ^a   Tajiri, H ^b   Yashiro, W ^b   Nakatani, S ^b   Takahashi, T ^b   Sugiyama, H ^c   Zhang, X ^c   Kawata, H ^c  

^a NAGOYA UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

Interface states; Surface relaxation and reconstruction; Surface structure, morphology, roughness, and topography; X ray scattering, diffraction, and reflection

Indexed keywords

DIFFRACTION; INTERFACES (MATERIALS); REFLECTION; SCANNING TUNNELING MICROSCOPY; SCATTERING; SILVER; SUBSTRATES; SURFACE ROUGHNESS; SURFACE STRUCTURE; SYNCHROTRON RADIATION; X RAY ANALYSIS;

GRAZING INCIDENCE;

SEMICONDUCTING SILICON;

EID: 18744419114     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01216-X     Document Type: Conference Paper

References (9)