Structural study of Si(1 1 1)√21 × √21-(Ag + Au) surface by X-ray diffraction

Surface Science

Volumn 493, Issue 1-3, 2001, Pages 214-220

  Tajiri, H ^a   Sumitani, K ^a   Yashiro, W ^a   Nakatani, S ^a   Takahashi, T ^a   Akimoto, K ^b   Sugiyama, H ^c   Zhang, X ^c   Kawata, H ^c  

^a UNIVERSITY OF TOKYO   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

^c INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

Author keywords

Gold; Silicon; Silver; Surface relaxation and reconstruction; Surface structure, morphology, roughness, and topography; X ray scattering, diffraction, and reflection

Indexed keywords

ADSORPTION; GOLD; HONEYCOMB STRUCTURES; INTERFACES (MATERIALS); SCANNING TUNNELING MICROSCOPY; SILVER; SURFACE TOPOGRAPHY; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

SURFACE RELAXATION;

SEMICONDUCTING SILICON;

EID: 0035500528     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01219-5     Document Type: Conference Paper

References (15)