Observation of Si(1 1 1)-√3 × √3-Ag surface at room temperature by reflection high-energy positron diffraction

Applied Surface Science

Volumn 244, Issue 1-4, 2005, Pages 166-169

  Fukaya, Y ^a   Kawasuso, A ^a   Hayashi, K ^a   Ichimiya, A ^a  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

Reflection high energy positron diffraction (RHEPD); Silicon; Silver; Surface structure; Total reflection

Indexed keywords

HIGH ENERGY ELECTRON DIFFRACTION; POSITRONS; SCANNING TUNNELING MICROSCOPY; SILICON; SILVER; X RAY DIFFRACTION;

ATOMIC HEIGHTS; REFLECTION HIGH-ENERGY POSITRON DIFFRACTION (RHEPD); ROOM TEMPERATURE; TOTAL REFLECTION;

SURFACE STRUCTURE;

EID: 15844424861     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.10.077     Document Type: Conference Paper

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