Conduction model of SnO2 thin films based on conductance and Hall effect measurements

Journal of Applied Physics

Volumn 100, Issue 3, 2006, Pages

  Oprea, A ^a   Moretton, E ^b   Barsan N ^a   Becker, W J ^c   Wollenstein J ^b   Weimar, U ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b FRAUNHOFER INSTITUTE FOR PHYSICAL MEASUREMENT TECHNIQUES IPM   (Germany)

^c UNIVERSITY OF KASSEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CARBON MONOXIDE; CHARGE CARRIERS; ELECTRIC CONDUCTANCE; ELECTRODES; ELECTRON BEAMS; EVAPORATION; GRAIN SIZE AND SHAPE; HALL EFFECT; NITROGEN; OHMIC CONTACTS; OXYGEN; PLATINUM; SINGLE CRYSTALS; SUBSTRATES; THIN FILMS;

CONDUCTION MODEL; ELECTROKINETIC PARAMETERS; HALL EFFECT MEASUREMENTS; PLATINUM ELECTRODES; QUASICHEMICAL EQUATIONS;

TIN COMPOUNDS;

EID: 33747467832     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2229802     Document Type: Article

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