Characterization of SnO2 thin films through thermoelectric power measurements

Thin Solid Films

Volumn 342, Issue 1, 1999, Pages 160-166

  Gordillo, G ^a   Paez, B ^a   Jacome C ^a   Florez J M ^b  

^a UNIVERSIDAD NACIONAL DE COLOMBIA   (Colombia)

^b UNIVERSIDAD DISTRITAL FRANCISCO JOSÉ DE CALDAS   (Colombia)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CRYSTAL LATTICES; ELECTRIC CONDUCTIVITY MEASUREMENT; FILM GROWTH; IMPURITIES; LIGHT POLARIZATION; LIGHT SCATTERING; NEGATIVE IONS; PYROLYSIS; SEMICONDUCTING TIN COMPOUNDS; SEMICONDUCTOR DOPING; THIN FILMS;

THERMOELECTRIC POWER MEASUREMENT;

SEMICONDUCTING FILMS;

EID: 0032663321     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01485-0     Document Type: Article

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