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Volumn 19, Issue 3, 2006, Pages 385-388
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Resist-pattern guided self-assembly of symmetric diblock copolymer
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Author keywords
AFM; Block copolymer; Graphoepitaxy; Self assembly
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Indexed keywords
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EID: 33747445554
PISSN: 09149244
EISSN: 13496336
Source Type: Journal
DOI: 10.2494/photopolymer.19.385 Document Type: Article |
Times cited : (15)
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References (9)
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