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Volumn 15, Issue 4, 2006, Pages 745-755

Piezoelectrically actuated tunable capacitor

Author keywords

Parylene; Tunable capacitor; Zinc oxide

Indexed keywords

CAPACITORS; COMPUTER SIMULATION; MICROMACHINING; SEMICONDUCTOR DEVICE MANUFACTURE; TUNING; ZINC OXIDE;

EID: 33747423682     PISSN: 10577157     EISSN: None     Source Type: Journal    
DOI: 10.1109/JMEMS.2006.878886     Document Type: Article
Times cited : (26)

References (13)
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    • Larson, L.1
  • 6
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    • J. Y. Park, Y. J. Yee, H. J. Nam, and J. U. Bu, "Micromachined RF MEMS tunable capacitors using piezoelectric actuators," in Proc. IEEE MTT-S Int. Microwave Symp. Dig., 2001, vol. 3, pp. 2111-2114.
    • (2001) Proc. IEEE MTT-S Int. Microwave Symp. Dig. , vol.3 , pp. 2111-2114
    • Park, J.Y.1    Yee, Y.J.2    Nam, H.J.3    Bu, J.U.4
  • 9
    • 0031235285 scopus 로고    scopus 로고
    • "Modeling and optimal design of piezoelectric cantilever microactuators"
    • Sep
    • D. DeVoe and A. P. Pisano, "Modeling and optimal design of piezoelectric cantilever microactuators," J. Microelectromech. Syst., vol. 6, pp. 266-270, Sep. 1997.
    • (1997) J. Microelectromech. Syst. , vol.6 , pp. 266-270
    • DeVoe, D.1    Pisano, A.P.2
  • 10
    • 0033338026 scopus 로고    scopus 로고
    • "Working equations for piezoelectric actuators and sensors"
    • Dec
    • M. S. Weinberg, "Working equations for piezoelectric actuators and sensors," J. Microelectromech. Syst., vol. 8, no. 4, pp. 529-533, Dec. 1999.
    • (1999) J. Microelectromech. Syst. , vol.8 , Issue.4 , pp. 529-533
    • Weinberg, M.S.1
  • 12
    • 0001550969 scopus 로고    scopus 로고
    • "Multi-mode noise analysis of cantilevers for scanning probe microscopy"
    • Mar
    • M. V. Salapaka, H. S. Bergh, J. Lai, A. Majumdar, and E. McFarland, "Multi-mode noise analysis of cantilevers for scanning probe microscopy," J. Appl. Phys., vol. 81, pp. 2480-2487, Mar. 1997.
    • (1997) J. Appl. Phys. , vol.81 , pp. 2480-2487
    • Salapaka, M.V.1    Bergh, H.S.2    Lai, J.3    Majumdar, A.4    McFarland, E.5
  • 13
    • 0032097444 scopus 로고    scopus 로고
    • "Measurement of piezoelectric strength of ZnO thin films for MEMS applications"
    • Jun
    • F. J. von Preissig, H. Zeng, and E. S. Kim, "Measurement of piezoelectric strength of ZnO thin films for MEMS applications," J. Smart Mater. Struct., vol. 7, pp. 396-403, Jun. 1998.
    • (1998) J. Smart Mater. Struct. , vol.7 , pp. 396-403
    • von Preissig, F.J.1    Zeng, H.2    Kim, E.S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.