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Volumn 16, Issue 9, 2006, Pages 1841-1846

A thick photoresist process for advanced wafer level packaging applications using JSR THB-151N negative tone UV photoresist

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; ELECTROPLATING; FLUIDICS; MOLDS; PHOTORESISTS; SOLDERING;

EID: 33747242692     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/16/9/012     Document Type: Article
Times cited : (41)

References (12)
  • 1
    • 33847078941 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors 2003 Assembly and Packaging http://piblic.itrs.net
    • (2003) Assembly and Packaging
  • 3
    • 0033098524 scopus 로고    scopus 로고
    • Materials issues in area-arry microelectronic packaging
    • Frear D R 1999 Materials issues in area-arry microelectronic packaging J. Met. 51 22-7
    • (1999) J. Met. , vol.51 , pp. 22-27
    • Frear, D.R.1
  • 4
    • 33747295093 scopus 로고    scopus 로고
    • Reliability of a wafer level CSP
    • Goodman T and Elenius P 1999 Reliability of a wafer level CSP Proc. APACK pp 76-82
    • (1999) Proc. APACK , pp. 76-82
    • Goodman, T.1    Elenius, P.2
  • 7
    • 0036646187 scopus 로고    scopus 로고
    • SU-8 thick photoresist processing as a functional material for MEMS applications
    • Conradie E H and Moore D F 2002 SU-8 thick photoresist processing as a functional material for MEMS applications J. Micromech. Microeng. 12 368-74
    • (2002) J. Micromech. Microeng. , vol.12 , Issue.4 , pp. 368-374
    • Conradie, E.H.1    Moore, D.F.2
  • 9
    • 0038487752 scopus 로고    scopus 로고
    • Realization of electroplating molds with thick positive SPR 220-7 photoresist
    • Kukharenka E and Kraft M 2003 Realization of electroplating molds with thick positive SPR 220-7 photoresist J. Mater. Sci.: Mater. Electron. 14 319-22
    • (2003) J. Mater. Sci.: Mater. Electron. , vol.14 , Issue.5-7 , pp. 319-322
    • Kukharenka, E.1    Kraft, M.2
  • 10
  • 12
    • 0026840123 scopus 로고
    • High depth to width aspect ratios in thick positive photoresist layers using near UV lithography
    • Engelmann G and Reichl H 1992 High depth to width aspect ratios in thick positive photoresist layers using near UV lithography Microelectron. Eng. 17 303-6
    • (1992) Microelectron. Eng. , vol.17 , Issue.1-4 , pp. 303-306
    • Engelmann, G.1    Reichl, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.