On the aging of avalanche light emission from silicon junctions

IEEE Transactions on Electron Devices

Volumn 46, Issue 6, 1999, Pages 12341239-

  De La Bardonnie, M ^a,b,c   Jiang, Dong ^a,b,c   Kerns, Sherra E ^a,b,c   Kerns Jr , David V ^a,b,c   Mialhe, Pierre ^a,b,c   Charles, Jean Pierre ^a,b,c   Huffman, Alain ^a,b,c  

^a VANDERBILT UNIVERSITY   (United States)

^b UNIVERSITÉ DE PERPIGNAN   (France)

^c Cent Lorrain d'Optique et   (France)

Author keywords

Light emission; Semiconductor devices; Silicon

Indexed keywords

EID: 33747175066     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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