Correlation Between 1/F Noise and HFE Long-Term Instability in Silicon Bipolar Devices

IEEE Transactions on Electron Devices

Volumn 38, Issue 11, 1991, Pages 2540-2547

  Zhuang, Yiqi ^a   Sun, Qing ^a  

^a XIDIAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

OXIDES; SEMICONDUCTING SILICON; TRANSISTORS, BIPOLAR;

ACCELERATED LIFE TESTS; HIGH TEMPERATURE STORAGE;

SEMICONDUCTOR DEVICES, BIPOLAR;

EID: 0026253935     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.97420     Document Type: Article

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