Kelvin probe force microscopy on corona charged oxidized semiconductor surfaces

Applied Physics Letters

Volumn 85, Issue 20, 2004, Pages 4801-4803

  Lagel B ^a   Ayala, M D ^a   Schlaf, R ^a  

^a University of South Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COULOMB FORCES; OSCILLATION AMPLITUDE; SURFACE POTENTIAL;

ATOMIC FORCE MICROSCOPY; CAPACITORS; ELECTRIC CORONA; INTERFACES (MATERIALS); MATHEMATICAL MODELS; OXIDATION;

SEMICONDUCTOR MATERIALS;

EID: 10944250519     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1818343     Document Type: Article

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