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Volumn 420, Issue 1, 1999, Pages

Absence of final-state screening shifts in photoemission spectroscopy frontier orbital alignment measurements at organic/semiconductor interfaces

Author keywords

Growth photoelectron emission surface electronic phenomena; Metal semiconductor interfaces; Metal semiconductor nonmagnetic heterostructures; Semiconducting films; Surfaces and or films; Visible and ultraviolet photoelectron spectroscopy

Indexed keywords

CHLORINE COMPOUNDS; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; GRAPHITE; HETEROJUNCTIONS; PHOTOEMISSION; SEMICONDUCTING FILMS; SEMICONDUCTOR METAL BOUNDARIES; THIN FILMS; ULTRAVIOLET SPECTROSCOPY; VAPOR DEPOSITION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0032784366     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00850-4     Document Type: Article
Times cited : (27)

References (37)
  • 19
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    • Jacobi, K.1
  • 20
    • 0000478561 scopus 로고
    • Jacobi K. Phys. Rev. B 38:(9):1988;5869.
    • (1988) Phys. Rev. , vol.38 , Issue.9 , pp. 5869
    • Jacobi, K.1
  • 28
    • 0003813640 scopus 로고
    • A.W. Czanderna. Amsterdam: Elsevier Publishing Company
    • Riggs W.M., Parker M.J. Czanderna A.W. Methods of Surface Analysis. 1975;103-158 Elsevier Publishing Company, Amsterdam.
    • (1975) Methods of Surface Analysis , pp. 103-158
    • Riggs, W.M.1    Parker, M.J.2
  • 31
    • 0040202356 scopus 로고    scopus 로고
    • unpublished results
    • R. Schlaf, unpublished results.
    • Schlaf, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.