|
Volumn 420, Issue 1, 1999, Pages
|
Absence of final-state screening shifts in photoemission spectroscopy frontier orbital alignment measurements at organic/semiconductor interfaces
|
Author keywords
Growth photoelectron emission surface electronic phenomena; Metal semiconductor interfaces; Metal semiconductor nonmagnetic heterostructures; Semiconducting films; Surfaces and or films; Visible and ultraviolet photoelectron spectroscopy
|
Indexed keywords
CHLORINE COMPOUNDS;
ELECTRONIC STRUCTURE;
EMISSION SPECTROSCOPY;
GRAPHITE;
HETEROJUNCTIONS;
PHOTOEMISSION;
SEMICONDUCTING FILMS;
SEMICONDUCTOR METAL BOUNDARIES;
THIN FILMS;
ULTRAVIOLET SPECTROSCOPY;
VAPOR DEPOSITION;
X RAY PHOTOELECTRON SPECTROSCOPY;
CHLOROINDIUM PHTHALOCYANINE;
PHOTOEMISSION SPECTROSCOPY;
WORK FUNCTION MEASUREMENT;
INTERFACES (MATERIALS);
|
EID: 0032784366
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(98)00850-4 Document Type: Article |
Times cited : (27)
|
References (37)
|