Atomic resolution electron tomography: A dream?

International Journal of Materials Research

Volumn 97, Issue 7, 2006, Pages 872-879

  Van Dyck, Dirk ^a   Van Aert, Sandra ^a   Croitoru, Mihail ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Atomic resolution; Electron tomography; Precision

Indexed keywords

AMORPHOUS MATERIALS; ATOMS; CRYSTAL ORIENTATION; POSITION MEASUREMENT; SCATTERING;

ATOMIC RESOLUTIONS; CHANNELING THEORY; ELECTRON TOMOGRAPHY; PRECISION;

TOMOGRAPHY;

EID: 33746925672     PISSN: 18625282     EISSN: None     Source Type: Journal    
DOI: 10.3139/146.101314     Document Type: Article

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