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Volumn 21, Issue 5, 2006, Pages 1221-1228

Characterization and control of microstructure in combinatorially prepared aluminum-silicon thin film nanocomposites

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; AMORPHOUS SILICON; ATOMIC FORCE MICROSCOPY; NANOSTRUCTURED MATERIALS; SILICON; SPUTTER DEPOSITION; THIN FILMS; X RAY DIFFRACTION;

EID: 33746494163     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2006.0164     Document Type: Article
Times cited : (14)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.