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Volumn 17, Issue 8, 2006, Pages 577-586

Creep properties of Sn-3.5Ag-0.5Cu lead-free solder under step-loading

Author keywords

[No Author keywords available]

Indexed keywords

CREEP TESTING; LOAD TESTING; MATHEMATICAL MODELS; STRESSES; TERNARY SYSTEMS; THERMAL EFFECTS;

EID: 33746341504     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-006-0002-7     Document Type: Article
Times cited : (11)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.