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Volumn 100, Issue 1, 2006, Pages

Effect of substrate roughness on photoluminescence spectra of silicon nanocrystals grown by off axis pulsed laser deposition

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT ABSORPTION; PHOTOLUMINESCENCE; PULSED LASER DEPOSITION; SEMICONDUCTOR QUANTUM DOTS; SILICA; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33746211126     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2209432     Document Type: Article
Times cited : (52)

References (44)
  • 30
    • 0037997768 scopus 로고
    • Card No. 9-185
    • Joint Committee on Powder Diffraction Standards, Powder Diffraction File, Card No. 9-185 (1967).
    • (1967) Powder Diffraction File
  • 32
    • 0004210109 scopus 로고    scopus 로고
    • New Age International (p) Limited, New Delhi, India
    • A. Goswami, Thin Film Fundamentals (New Age International (p) Limited, New Delhi, India, 1996).
    • (1996) Thin Film Fundamentals
    • Goswami, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.