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Volumn 90, Issue 10, 2001, Pages 5075-5080

Annealing effects on structures and optical properties of silicon nanostructured films prepared by pulsed-laser ablation in inert background gas

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EID: 0035890597     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1412834     Document Type: Article
Times cited : (42)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.