Marching to the beat of Moore's Law

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6151 I, Issue , 2006, Pages

  Borodovsky, Yan ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT MANUFACTURE; LITHOGRAPHY; LOGIC DEVICES; SYNCHRONIZATION; CUSTOMER SATISFACTION; DECISION MAKING; LARGE SCALE SYSTEMS; PROBABILITY DENSITY FUNCTION; PRODUCT DESIGN; RISK ASSESSMENT; TRANSISTORS;

AFFORDABILITY; EVOLUTIONARY APPROACH; SYNCHRONIZING GUIDANCE; TRANSISTOR COUNT; AREA DENSITY SCALING; GORDON MOORE; MATERIALS SUPPLIERS;

INTEGRATED CIRCUITS;

EID: 33745624258     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.655176     Document Type: Conference Paper

References (23)

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