Evaluation of SET and SEU effects at multiple abstraction levels

Proceedings - 11th IEEE International On-Line Testing Symposium, IOLTS 2005

Volumn 2005, Issue , 2005, Pages 309-312

  Anghel, L ^a   Leveugle, R ^a   Vanhauwaert, P ^a  

^a TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EVALUATION; FAULT TOLERANT COMPUTER SYSTEMS; MATHEMATICAL MODELS;

SINGLE EVENT TRANSIENTS (SET); SINGLE EVENT UPSETS (SEU);

DIGITAL INTEGRATED CIRCUITS;

EID: 33745502880     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2005.28     Document Type: Conference Paper

References (9)

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