Efficient estimation of SEU effects in SRAM-based FPGAs

Proceedings - 11th IEEE International On-Line Testing Symposium, IOLTS 2005

Volumn 2005, Issue , 2005, Pages 54-59

  Reorda, M Sonza ^a   Sterpone, L ^a   Violante, M ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE EQUIPMENT; FAILURE ANALYSIS; SENSITIVITY ANALYSIS; STATIC RANDOM ACCESS STORAGE;

CONFIGURATION MEMORY; DEPENDABILITY; SINGLE EVENT UPSETS (SEU); STATIC ANALYSIS;

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 33745495215     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2005.26     Document Type: Conference Paper

References (14)

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