Radiation effects on current field programmable technologies

IEEE Transactions on Nuclear Science

Volumn 44, Issue 6 PART 1, 1997, Pages 1945-1956

  Katz, R ^a,d   Label, K ^b   Wang, J J ^c   Cronquist, B ^d   Koga, R ^a   Penzin, S ^b   Swift, G ^c  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b Actel Corp   (United States)

^c AEROSPACE CORPORATION   (United States)

^d CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; DATA STORAGE EQUIPMENT; LOGIC DESIGN; RADIATION EFFECTS; SPACE FLIGHT;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA); SINGLE EVENT SUSCEPTIBILITY;

LOGIC DEVICES;

EID: 0031358694     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.658966     Document Type: Article

References (10)

1. R. Katz, R. Barto, P. McKerracher, B. Carkhuff, and R. Koga, SEIT Hardening of FPGAs for Space Applications and Device Characterization, IEEE Transactions on Nuclear Science, Dec., 1994.
2. R. Katz, R. Barto, and G. Swift, Anti-fuse/FPGA Reliability in the Heavy Ion Environment, NASA Tech Briefs, 1995.
3. R. Katz and G. Swift, Diagnosis of Multiple Faults Using IDDQ Techniques, International Test Conference IDDQ Workshop, 1995.
4. R. Katz and G. Swift, Total Dose Response of Actel 1020B and 2080A Field Programmable Gâta Arrays, RADEC's, 1995.
5. Quicklogic, pASIC 2 FPGA Family White Paper, http:// www.quicklogic.com/techinfo/whitppr/whitppr.htm.
6. J. Wert, UTMC UT22VP10 PAL Single Event Effects Test Report, 9-5574-WEW95-139, Boeing Defense and Space Group, June, 1996.
7. Actel Corporation, Design Techniques for RadiationHardened Field Programmable Gate Arrays, Rev. 1, 1996, Edited by K. Hayes and R. Katz.
8. Xilinx Corp., The Future of FPGAs, http://www.xilinx. com, 1997.
9. Xilinx Corp.. The Programmable Logic Data Book. 1994.
10. Xilinx Corp., XC6200 Field Programmable Gate Arrays, 1994.