Ion beam testing of ALTERA APEX FPGAs

IEEE Radiation Effects Data Workshop

Volumn 2002-January, Issue , 2002, Pages 45-50

  Ceschia, M ^a   Bellato, M ^a   Paccagnella, A ^a   Kaminski, A ^b   Lee, S C ^c   Wan, C ^c   Menichelli, M ^b   Papi, A ^b   Wyss, J ^d  

^a UNIVERSITY OF PADOVA   (Italy)

^b SEZIONE DI PADOVA   (Italy)

^c INSTITUTE OF PHYSICS   (Taiwan)

^d UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

Author keywords

Circuit testing; Control systems; Energy exchange; Error correction; Field programmable gate arrays; Ion beams; Manufacturing; Performance evaluation; Shift registers; Single event upset

Indexed keywords

COMPUTER CONTROL SYSTEMS; CONTROL SYSTEMS; DIGITAL STORAGE; ENERGY TRANSFER; ERROR CORRECTION; FIELD PROGRAMMABLE GATE ARRAYS (FPGA); FLASH MEMORY; HEAVY IONS; ION BEAMS; ION BOMBARDMENT; ION EXCHANGE; IRRADIATION; LOGIC GATES; MANUFACTURE; RADIATION; RADIATION HARDENING; SHIFT REGISTERS; SIGNAL RECEIVERS; STATIC RANDOM ACCESS STORAGE;

CIRCUIT TESTING; CONFIGURATION MEMORY; ENERGY EXCHANGES; LINEAR ENERGY TRANSFER; PERFORMANCE EVALUATION; SINGLE EVENT EFFECTS; SINGLE EVENT UPSETS; TRIPLE MODULAR REDUNDANT;

RADIATION EFFECTS;

EID: 84948768331     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2002.1045531     Document Type: Conference Paper

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