Excess noise measurement in avalanche photodiodes using a transimpedance amplifier front-end

Measurement Science and Technology

Volumn 17, Issue 7, 2006, Pages 1941-1946

  Lau, K S ^a   Tan, C H ^a   Ng, B K ^b   Li, K F ^c   Tozer, R C ^a   David, J P R ^a   Rees, G J ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^c Jennic Ltd   (United Kingdom)

Author keywords

Avalanche photodiodes; Excess noise factor; Phase sensitive detection; Transimpedance amplifier

Indexed keywords

AVALANCHE DIODES; CAPACITANCE; ELECTRIC CURRENTS; ELECTRIC IMPEDANCE; MEASUREMENT THEORY; SPURIOUS SIGNAL NOISE;

AVALANCHE PHOTODIODES; EXCESS NOISE FACTOR; PHASE-SENSITIVE DETECTION; TRANSIMPEDANCE AMPLIFIER;

PHOTODIODES;

AVALANCHE DIODES; CAPACITANCE; ELECTRIC CURRENTS; ELECTRIC IMPEDANCE; MEASUREMENT THEORY; PHOTODIODES; SPURIOUS SIGNAL NOISE;

EID: 33745487841     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/17/7/036     Document Type: Conference Paper

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