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Volumn 73, Issue 24, 2006, Pages

Photoionization measurement of deep defects in single-crystalline CVD diamond using the transient-current technique

Author keywords

[No Author keywords available]

Indexed keywords


EID: 33745088965     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.73.245207     Document Type: Article
Times cited : (27)

References (18)
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    • JPAPBE 0022-3727 10.1088/0022-3727/29/7/036
    • M. L. Williams and I. J. Donnelly, J. Phys. D JPAPBE 0022-3727 10.1088/0022-3727/29/7/036 29, 1997 (1996).
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    • Williams, M.L.1    Donnelly, I.J.2
  • 15
    • 0345534598 scopus 로고    scopus 로고
    • PSSABA. 0031-8965. 10.1002/(SICI)1521-396X(199903)172:1<113::AID- PSSA113>3.0.CO;2-I
    • J. Rosa, M. Vaněček, M. Nesládek, and L. M. Stals, Phys. Status Solidi A PSSABA 0031-8965 10.1002/(SICI)1521-396X(199903)172: 1<113::AID-PSSA113>3.0.CO;2-I 172, 113 (1999).
    • (1999) Phys. Status Solidi a , vol.172 , pp. 113
    • Rosa, J.1    Vaněček, M.2    Nesládek, M.3    Stals, L.M.4
  • 17
    • 21944441153 scopus 로고
    • JPSOAW 0022-3719 10.1088/0022-3719/14/7/012
    • J. C. Inkson, J. Phys. C JPSOAW 0022-3719 10.1088/0022-3719/14/7/012 14, 1093 (1981).
    • (1981) J. Phys. C , vol.14 , pp. 1093
    • Inkson, J.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.