Charge-carrier properties in synthetic single-crystal diamond measured with the transient-current technique

Journal of Applied Physics

Volumn 97, Issue 7, 2005, Pages

  Pernegger, H ^a   Roe, S ^a   Weilhammer, P ^a,h   Eremin, V ^b   Frais Kolbl H ^c   Griesmayer, E ^c   Kagan, H ^d   Schnetzer, S ^e   Stone, R ^e   Trischuk, W ^f   Twitchen, D ^g   Whitehead, A ^g  

^a CERN   (Switzerland)

^b IOFFE INSTITUTE   (Russian Federation)

^c UNIVERSITY OF APPLIED SCIENCES WIENER NEUSTADT   (Austria)

^d OHIO STATE UNIVERSITY   (United States)

^e State University of New Jersey   (United States)

^f UNIVERSITY OF TORONTO   (Canada)

^g ELEMENT SIX LTD   (United Kingdom)

^h UNIVERSITY OF PERUGIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIER LIFETIMES; HOLE DRIFT VELOCITIES; IONIZATION CHARGE; TRANSIENT-CURRENT TECHNIQUE (TCT);

CHARGED PARTICLES; CHEMICAL VAPOR DEPOSITION; DIAMONDS; ELECTRIC FIELDS; ELECTRIC SPACE CHARGE; ELECTRODES; IONIZATION; PARTICLE DETECTORS; SINGLE CRYSTALS;

CHARGE CARRIERS;

EID: 20244382427     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1863417     Document Type: Article

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