Metrics for performance benchmarking of nanoscale Si and carbon nanotube FETs including device nonidealities

IEEE Transactions on Electron Devices

Volumn 53, Issue 6, 2006, Pages 1317-1322

  Deng, Jie ^a   Wong, H S Philip ^a  

^a Stanford University   (United States)

Author keywords

Carbon nanotube FET (CNFET); CMOS; Effective drive current; Modeling; Nanoscale

Indexed keywords

BENCHMARKING; CARBON NANOTUBES; CMOS INTEGRATED CIRCUITS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC INVERTERS; PERFORMANCE; SEMICONDUCTING SILICON;

CARBON NANOTUBE FET (CNFET); EFFECTIVE DRIVE CURRENT; EXPRESSION;

FIELD EFFECT TRANSISTORS;

EID: 33744788929     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2006.874159     Document Type: Article

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