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Volumn 6, Issue 5, 2006, Pages 953-957
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Measurement of the adhesion force between carbon nanotubes and a silicon dioxide substrate
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Author keywords
[No Author keywords available]
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Indexed keywords
ADHESION FORCE;
AXIAL TENSION;
FORCE DISTANCE MODES;
SINGLE-WALLED NANOTUBES;
ADHESION;
ATOMIC FORCE MICROSCOPY;
LITHOGRAPHY;
SILICA;
SUBSTRATES;
CARBON NANOTUBES;
CARBON NANOTUBE;
SILICON DIOXIDE;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMISTRY;
STATIC ELECTRICITY;
MICROSCOPY, ATOMIC FORCE;
NANOTUBES, CARBON;
SILICON DIOXIDE;
STATIC ELECTRICITY;
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EID: 33744784591
PISSN: 15306984
EISSN: None
Source Type: Journal
DOI: 10.1021/nl060018t Document Type: Article |
Times cited : (44)
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References (15)
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