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Physical Chemistry Chemical Physics

Volumn 8, Issue 15, 2006, Pages 1834-1836

Anomalous roughness evolution of rubrene thin films observed in real time during growth

(7) Kowarik, S a,b Gerlach, A a,b Sellner, S b Schreiber, F a,b Pflaum, J c Cavalcanti, L d Konovalov, O d

a UNIVERSITY OF OXFORD (United Kingdom)

b UNIVERSITY OF TÜBINGEN (Germany)

c UNIVERSITY OF STUTTGART (Germany)

d EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

Author keywords

[No Author keywords available]

Indexed keywords

NAPHTHACENE DERIVATIVE; ORGANIC COMPOUND; RUBRENE; SILICON DIOXIDE;

ARTICLE; CHEMISTRY; SEMICONDUCTOR; SPECTROMETRY; SURFACE PROPERTY; TIME;

NAPHTHACENES; ORGANIC CHEMICALS; SEMICONDUCTORS; SILICON DIOXIDE; SPECTROMETRY, X-RAY EMISSION; SURFACE PROPERTIES; TIME FACTORS;

EID: 33744499995 PISSN: 14639076 EISSN: None Source Type: Journal
DOI: 10.1039/b517866e Document Type: Article

Times cited : (46)

References (18)

1
- 0037451354
- V. Podzorov V. M. Pudalov M. E. Gershenson Appl. Phys. Lett. 2003 82 1739 1741
- (2003) Appl. Phys. Lett. , vol.82 , pp. 1739-1741
- Podzorov, V.¹ Pudalov, V.M.² Gershenson, M.E.³

2
- 9744261680
- A. F. Stassen R. W. I. de Boer N. N. Iosad A. F. Morpurgo Appl. Phys. Lett. 2004 85 3899 3901
- (2004) Appl. Phys. Lett. , vol.85 , pp. 3899-3901
- Stassen, A.F.¹ De Boer, R.W.I.² Iosad, N.N.³ Morpurgo, A.F.⁴

3
- 1542723292
- V. C. Sundar J. Zaumseil V. Podzorov E. Menard R. L. Willett T. Someya M. E. Gershenson J. A. Rogers Science 2004 303 1644 1646
- (2004) Science , vol.303 , pp. 1644-1646
- Sundar, V.C.¹ Zaumseil, J.² Podzorov, V.³ Menard, E.⁴ Willett, R.L.⁵ Someya, T.⁶ Gershenson, M.E.⁷ Rogers, J.A.⁸

4
- 0942277780
- G. Li J. Shinar Appl. Phys. Lett. 2003 83 5359 5361
- (2003) Appl. Phys. Lett. , vol.83 , pp. 5359-5361
- Li, G.¹ Shinar, J.²

5
- 79956019454
- H. Aziz Z. D. Popovic Appl. Phys. Lett. 2002 80 2180 2182
- (2002) Appl. Phys. Lett. , vol.80 , pp. 2180-2182
- Aziz, H.¹ Popovic, Z.D.²

6
- 0032607944
- G. Sakamoto C. Adachi T. Koyama Y. Taniguchi C. D. Merritt H. Murata Z. H. Kafafi Appl. Phys. Lett. 1999 75 766 768
- (1999) Appl. Phys. Lett. , vol.75 , pp. 766-768
- Sakamoto, G.¹ Adachi, C.² Koyama, T.³ Taniguchi, Y.⁴ Merritt, C.D.⁵ Murata, H.⁶ Kafafi, Z.H.⁷

7
- 23844540635
- D. Käfer G. Witte Phys. Chem. Chem. Phys. 2005 7 2850 2853
- (2005) Phys. Chem. Chem. Phys. , vol.7 , pp. 2850-2853
- Käfer, D.¹ Witte, G.²

8
- 2942592416
- F. Schreiber Phys. Status Solidi A 2004 201 1037 1054
- (2004) Phys. Status Solidi a , vol.201 , pp. 1037-1054
- Schreiber, F.¹

9
- 33744476617
- W. Brütting Phys. Status Solidi A 2004 201 1035 1035
- (2004) Phys. Status Solidi a , vol.201 , pp. 1035-1035
- Brütting, W.¹

10
- 0347058684
- G. Witte C. Wöll Phase Transitions 2003 76 291 305
- (2003) Phase Transitions , vol.76 , pp. 291-305
- Witte, G.¹ Wöll, C.²

11
- 28844436500
- D. Käfer L. Ruppel G. Witte Ch. Wöll Phys. Rev. Lett. 2005 95 166602
- (2005) Phys. Rev. Lett. , vol.95 , pp. 166602
- Käfer, D.¹ Ruppel, L.² Witte, G.³ Wöll, Ch.⁴

12
- 0035247512
- K. A. Ritley B. Krause F. Schreiber H. Dosch Rev. Sci. Instrum. 2001 72 1453 1457
- (2001) Rev. Sci. Instrum. , vol.72 , pp. 1453-1457
- Ritley, K.A.¹ Krause, B.² Schreiber, F.³ Dosch, H.⁴

13
- 1242315534
- H. H. Fong S. K. So W. Y. Sham C. F. Lo Y. S. Wu C. H. Chen Chem. Phys. 2004 298 119 123
- (2004) Chem. Phys. , vol.298 , pp. 119-123
- Fong, H.H.¹ So, S.K.² Sham, W.Y.³ Lo, C.F.⁴ Wu, Y.S.⁵ Chen, C.H.⁶

14
- 0003469715
- Springer, Berlin
- M. Tolan, X-ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research, Springer, Berlin, 1999
- (1999) X-ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research
- Tolan, M.¹

15
- 33744502553
- Again, the Parrat formalism was used to fit the reflectivity, taking into account the slight change in thickness during each scan
- Again, the Parrat formalism was used to fit the reflectivity, taking into account the slight change in thickness during each scan

16
- 0031097281
- J. Krug Adv. Phys. 1997 46 139 282
- (1997) Adv. Phys. , vol.46 , pp. 139-282
- Krug, J.¹

17
- 0037428574
- A. C. Dürr F. Schreiber K. A. Ritley V. Kruppa J. Krug H. Dosch B. Struth Phys. Rev. Lett. 2003 90 016104
- (2003) Phys. Rev. Lett. , vol.90 , pp. 016104
- Dürr, A.C.¹ Schreiber, F.² Ritley, K.A.³ Kruppa, V.⁴ Krug, J.⁵ Dosch, H.⁶ Struth, B.⁷

18
- 24044524962
- M.-C. Blüm E. Cavar M. Pivetta F. Patthey W.-D. Schneider Angew. Chem., Int. Ed. 2005 44 5334 5337
- (2005) Angew. Chem., Int. Ed. , vol.44 , pp. 5334-5337
- Blüm, M.-C.¹ Cavar, E.² Pivetta, M.³ Patthey, F.⁴ Schneider, W.-D.⁵

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