Significant improvement of device durability in organic light-emitting diodes by doping both hole transport and emitter layers with rubrene molecules

Applied Physics Letters

Volumn 75, Issue 6, 1999, Pages 766-768

  Sakamoto, Gosuke ^a   Adachi, Chihaya ^a,c   Koyama, Toshiki ^a   Taniguchi, Yoshio ^a   Merritt, Charles D ^b   Murata, Hideyuki ^b   Kafafi, Zakya H ^b  

^a SHINSHU UNIVERSITY   (Japan)

^b NAVAL RESEARCH LABORATORY   (United States)

^c Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DURABILITY; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DOPING;

EMITTING LAYER (EML); HOLE TRANSPORT LAYER (HTL); ORGANIC LIGHT EMITTING DIODES (OLED); RUBRENE;

LIGHT EMITTING DIODES;

EID: 0032607944     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124506     Document Type: Article

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