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Volumn I, Issue , 2005, Pages 586-591

Increasing register file immunity to transient errors

Author keywords

[No Author keywords available]

Indexed keywords

DATA CORRUPTION; REGISTER DUPLICATION; SUPERSCALAR PROCESSORS; TRANSIENT ERRORS;

EID: 33646910220     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2005.181     Document Type: Conference Paper
Times cited : (54)

References (28)
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    • (1999) Intl. Symp. on Microarchitecture
    • Austin, T.1
  • 13
    • 0345045434 scopus 로고    scopus 로고
    • An adaptive write error detection technique in on-chip caches of multi-level caching systems
    • March
    • Kim, S. and A. K. Somani, An Adaptive Write Error Detection Technique in On-Chip Caches of Multi-Level Caching Systems, Journal of Microprocessors and Microsystems, March 1999, 22(9); p. 561-570.
    • (1999) Journal of Microprocessors and Microsystems , vol.22 , Issue.9 , pp. 561-570
    • Kim, S.1    Somani, A.K.2
  • 14
    • 0032653016 scopus 로고    scopus 로고
    • Area efficient architectures for information integrity in cache memories
    • Kim, S. and A. K. Somani. Area Efficient Architectures for Information Integrity in Cache Memories. In Intl. Symp. on Computer Architecture, 1999.
    • (1999) Intl. Symp. on Computer Architecture
    • Kim, S.1    Somani, A.K.2
  • 20
    • 29244437935 scopus 로고    scopus 로고
    • An accurate analysis of the effects of soft errors in the instruction and data caches of a pipelined microprocessor
    • Rebaudengo, M., M. S. Reorda, and M.Violante. An Accurate Analysis of the Effects of Soft Errors in the Instruction and Data Caches of a Pipelined Microprocessor. In Design, Automation and Test in Europe (DATE), 2003.
    • (2003) Design, Automation and Test in Europe (DATE)
    • Rebaudengo, M.1    Reorda, M.S.2    Violante, M.3
  • 25
    • 0029779792 scopus 로고    scopus 로고
    • Modeling the cosmic-ray-induced soft-error rate in integrated circuits: An overview
    • Jan.
    • Srinivasan, G. R., Modeling the Cosmic-Ray-Induced Soft-Error Rate in Integrated Circuits: An Overview. IBM Journal of Research and Development, Jan. 1996, 40(1): p. 77-89.
    • (1996) IBM Journal of Research and Development , vol.40 , Issue.1 , pp. 77-89
    • Srinivasan, G.R.1
  • 26
    • 84858948281 scopus 로고    scopus 로고
    • STMicroelectronics. STPC Microcontrollers - Overview, 2004, http://www.st.com/stonline/products/support/micro/stpc/home.htm.
    • (2004) STPC Microcontrollers - Overview


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.