Self-Latching Operation of MOBILE Circuits Using Series-Connection of RTDs and Transistors

IEEE Transactions on Circuits and Systems II: Express Briefs

Volumn 53, Issue 5, 2006, Pages 334-338

  Avedillo, María J ^a   Quintana, José M ^a   Pettenghi, Héctor ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE SEVILLA   (Spain)

Author keywords

MOBILE; resonant tunnel diode; self latching

Indexed keywords

ELECTRIC NETWORK SYNTHESIS; ELECTRIC NETWORK TOPOLOGY; FLIP FLOP CIRCUITS; RESONANT CIRCUITS; TRANSISTORS; TUNNEL DIODES;

MOBILE CIRCUITS; RESONANT TUNNEL DIODE; SELF-LATCHING OPERATION;

ELECTRIC NETWORK ANALYSIS;

EID: 33646875921     PISSN: 15497747     EISSN: 15583791     Source Type: Journal    
DOI: 10.1109/TCSII.2005.862280     Document Type: Article

References (8)

1. P. Mazumder, S. Kulkarni, M. Bhattacharya, J.-P. Sun, and G. I. Haddad, “Digital circuit applications of resonant tunneling devices,” Proc. IEEE, vol. 86, no. 4, pp. 664–686, Apr. 1998.
2. C. Pacha et al., “Threshold logic circuit design of parallel adders using resonant tunnelling devices,” IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 8, no. 5, pp. 558–572, Oct. 2000.
3. M. J. Avedillo et al., “Multi-threshold threshold logic circuit design using resonant tunneling devices,” Electron. Lett., vol. 39, pp. 1502–1504, 2003.
4. K. J. Chen, K. Maezawa, and M. Yamamoto, “InP-based high performance monostable-bistable transition logic elements (MOBILES) using integrated multiple-input resonant-tunneling devices,” IEEE Electron. Dev. Lett., vol. 17, no. 3, pp. 127–129, Mar. 1996.
5. W. Prost et al., “Logic Circuits with reduced complexity based on devices with higher functionality,” 1ST, EU 1ST Rep. LOCOM no. 28 844, Dec. 2000.
6. K. Sano, K. Murata, T. Otsuji, T. Akeyoshi, N. Shimizu, and E. Sano, “An 80-Gb/s optolectronic delayed flip-flop IC using resonant tunneling diodes and uni-traveling-carrier photodiode,” IEEE J. Solid-State Circuits, vol. 36, no. 2, pp. 281–289, Feb. 2001.
7. T. Uemura and P. Mazumder, “Rise time analysis of MOBILE circuit,” in Proc. IEEE Int. Symp. Circuits Syst. (ISCAS), vol. 5, 2002, pp. 26–29.
8. H. Matsuzaki, H. Fukuyama, and T. Enoki, “Analysis of transient response and operating speed of MOBILE,” IEEE Trans. Electron. Devices, vol. 51, no. 4, pp. 616–622, Apr. 2004.