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Volumn 21, Issue 15, 2001, Pages 2673-2676

Uncertainty of complex permittivity measurements by split-post dielectric resonator technique

Author keywords

Complex permittivity; Permittivity measurements; Split post dielectric resonator; Standard reference materials

Indexed keywords

ERROR ANALYSIS; FREQUENCIES; SINGLE CRYSTALS;

EID: 0035204925     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(01)00343-0     Document Type: Article
Times cited : (193)

References (13)
  • 2
    • 0006776722 scopus 로고
    • 01δ mode dielectric resonator for the complex permittivity measurements of semiconductors
    • (1986) CPEM '86 , pp. 154-155
    • Krupka, J.1    Maj, S.2
  • 3
    • 0006773877 scopus 로고
    • Precise measurement method for complex permittivity of microwave substrate
    • (1988) CPEM '88 , pp. 154-155
    • Nishikawa, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.