Material characterization using a quasi-optical measurement system

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 2, 2003, Pages 333-336

  Gagnon, Nicolas ^a   Shaker, Jafar ^a   Berini, Pierre ^b   Roy, Langis ^c   Petosa, Aldo ^a  

^a Industry Canada   (Canada)

^b UNIVERSITY OF OTTAWA   (Canada)

^c CARLETON UNIVERSITY   (Canada)

Author keywords

Dielectric materials; Dielectric measurements; Error correction; Gaussian beams; Genetic algorithms; Material parameter extraction; Permittivity measurement

Indexed keywords

CALIBRATION; DIELECTRIC MATERIALS; ERROR CORRECTION; GENETIC ALGORITHMS; NUMERICAL METHODS; OPTICAL VARIABLES MEASUREMENT; PERMITTIVITY MEASUREMENT; REFLECTION; WAVE TRANSMISSION;

DIELECTRIC MEASUREMENT; GAUSSIAN BEAMS; MATERIAL PARAMETER EXTRACTION; QUASI-OPTICAL MEASUREMENT SYSTEM; RELATIVE PERMITTIVITY;

OPTICAL DEVICES;

EID: 0038236955     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.810042     Document Type: Article

References (6)

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