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Volumn 47, Issue 10, 1999, Pages 2014-2020

Full-wave analysis of a split-cylinder resonator for nondestructive permittivity measurements

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC LOSSES; MATHEMATICAL MODELS; NONDESTRUCTIVE EXAMINATION; PERMITTIVITY MEASUREMENT; RESONANCE;

EID: 0033316914     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.795077     Document Type: Article
Times cited : (160)

References (7)
  • 2
    • 0024089859 scopus 로고
    • An evanescent-mode tester for ceramic dielectric substrates
    • Oct.
    • G. Kent, "An evanescent-mode tester for ceramic dielectric substrates," IEEE Trans. Microwave Theory Tech., vol. 36, pp. 1451-1454, Oct. 1988.
    • (1988) IEEE Trans. Microwave Theory Tech. , vol.36 , pp. 1451-1454
    • Kent, G.1
  • 3
    • 0030081001 scopus 로고    scopus 로고
    • Nondestructive permittivity measurement of substrates
    • Feb.
    • _, "Nondestructive permittivity measurement of substrates," IEEE Trans. Instrum. Meas., vol. 45, pp. 102-106, Feb. 1996.
    • (1996) IEEE Trans. Instrum. Meas. , vol.45 , pp. 102-106
  • 4
    • 0030086698 scopus 로고    scopus 로고
    • The gap correction for the resonant-mode dielectrometer
    • Feb.
    • G. Kent and S. Bell, "The gap correction for the resonant-mode dielectrometer," IEEE Trans. Instrum. Meas., vol. 45, pp. 98-101, Feb. 1996.
    • (1996) IEEE Trans. Instrum. Meas. , vol.45 , pp. 98-101
    • Kent, G.1    Bell, S.2
  • 5
    • 0028523064 scopus 로고
    • Analysis of an open-ended coaxial probe with lift-off for nondestructive testing
    • Oct.
    • J. Baker-Jarvis, M. Janezic, P. Domich, and R. Geyer, "Analysis of an open-ended coaxial probe with lift-off for nondestructive testing," IEEE Trans. Instrum. Meas., vol. 43, pp. 711-718, Oct. 1994.
    • (1994) IEEE Trans. Instrum. Meas. , vol.43 , pp. 711-718
    • Baker-Jarvis, J.1    Janezic, M.2    Domich, P.3    Geyer, R.4
  • 6
    • 0030084890 scopus 로고    scopus 로고
    • Analysis of a two-port flanged coaxial holder for shielding effectiveness and dielectric measurements of thin films and thin materials
    • Feb.
    • J. Baker-Jarvis and M. Janezic, "Analysis of a two-port flanged coaxial holder for shielding effectiveness and dielectric measurements of thin films and thin materials," IEEE Trans. Electromag. Compat., vol. 38, pp. 67-70, Feb. 1996.
    • (1996) IEEE Trans. Electromag. Compat. , vol.38 , pp. 67-70
    • Baker-Jarvis, J.1    Janezic, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.