Nondestructive permittivity measurement of substrates

IEEE Transactions on Instrumentation and Measurement

Volumn 45, Issue 1, 1996, Pages 102-106

  Kent, Gordon ^a,b  

^a IEEE

^b GDK Products   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAVITY RESONATORS; DIELECTRIC MATERIALS; MEASUREMENT ERRORS; NONDESTRUCTIVE EXAMINATION; SUBSTRATES;

RESONANT MODE DIELECTROMETER;

PERMITTIVITY MEASUREMENT;

EID: 0030081001     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.481319     Document Type: Article

References (14)

1. G. Kent and S. Bell, "The gap correction for the resonant mode dielectrometer," submitted for publication to the IEEE Trans. Instrum. Meas., this issue, pp. 98-101.
2. S. B. Cohn and K. C. Kelly, "Microwave measurement of high-dielectric constant materials," IEEE Trans. Microwave Theory Tech., vol. MTT-14, pp. 406-410, Sept. 1970.
3. G. Kent, "A dielectrometer for the measurement of substrate permittivity," Microwave J., vol. 34, no. 12, pp. 72-82, Dec. 1991.
4. _, "A resonant mode dielectrometer for substrates," 37'th ARFTG Conference Digest, June 1991.
5. _, "Accurate permittivity measurements with a resonant dielectrometer and a network analyzer," 17th ARMMS Conference Digest, University of Nottingham, Sept. 1992.
6. _, "Non-destructive permittivity measurements of substrates," Digest of the 1994 Conference on Precision electromagnetic measurements, IEEE Catalog no. 94CH3449-6, June 1994.
7. P. Guillon and Y. Garault, "Complex permittivity measurement of MIC substrate," AÜE. Band 35, Heft 3, pp. 102-104, 1981.
8. E. K. Smith and S. Weintraub, "The constants in the equation for atmospheric refractive index at radio frequencies," J. Research N.B.S., vol. 50, pp. 39-41, Jan. 1953.
9. R. K. Hoffman, Handbook of Microwave Integrated Circuits. Norwood, MA: Artech House, p. 200, 1987.
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11. G. Kent, private communication to William Severn. Saphikon, Inc., 51 Powers Street Milford, NII 03055, Jan. 28, 1992.
12. _, "Nondestructive measurement of the transverse dielectric constant of alumina substrates at microwave frequencies," Rep. 3-93, prepared under contract to Texas Instruments, Inc. by GDK Products, Cazenovia, NY, 1993.
13. _, "An evanescent-mode tester for ceramic dielectric substrates," IEEE Trans. Microwave Theory Tech., vol. 36, pp. 1451-1454, Oct. 1988.
14. E. Vanzura, National Institute of Standards and Technology, Boulder, CO, private communication to G. Kent, Oct. 28, 1993.