Complex permittivity measurements of thin ferroelectric films employing split post dielectric resonator

Ferroelectrics

Volumn 335, Issue , 2006, Pages 89-94

  Krupka, J ^a   Huang, Wei Te ^b   Tung, Mean Jue ^b  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

Dielectric properties; Ferroelectric thin films; Microwave measurements

Indexed keywords

DIELECTRIC LOSSES; MAGNETOELECTRIC EFFECTS; MICROWAVES; PERMITTIVITY; RESONATORS; SUBSTRATES;

DIELECTRIC SUBSTRATES; FERROELECTRIC FILMS; MICROWAVE MEASUREMENTS; SPLIT POST DIELECTRIC RESONATOR (SPDR);

FERROELECTRIC THIN FILMS;

EID: 33746855484     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190600689415     Document Type: Conference Paper

References (4)

1. 01δ mode dielectric resonator for the complex permittivity measurements of semiconductors. CPEM 86, 154-155 (1986).
2. T. Nishikawa, K. Wakino, H. Tanaka, and Y. Ishikawa, Precise measurement method for complex permittivity of microwave substrate. CPEM 88, 154-155 (1988).
3. J. Krupka, R. G. Geyer, J. Baker-Jarvis, and J. Ceremuga, Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques. DMMA 96 Conference, Bath, U.K. 23-26 Sept. 21-24 (1996).
4. J. Krupka, A. P. Gregory, O. C. Rochard, R. N. Clarke, B. Riddle, and J. Baker-Jarvis, Uncertainty of complex permittivity measurements by split-post dielectric resonator technique. Journal of the European Ceramic Society 21, 2673-2676 (2001).