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Volumn 96, Issue 19, 2006, Pages

International technology roadmap for semiconductors 2005 edition

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; INTERFACES (MATERIALS); MATHEMATICAL MODELS; OXIDATION; SILICA;

EID: 33646847886     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.196102     Document Type: Article
Times cited : (71)

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