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Journal of Materials Science: Materials in Electronics

Volumn 17, Issue 7, 2006, Pages 509-514

Comparative investigating the properties of Pb-based multilayer ferroelectric thin films for FeRAM

(4) Wang, LongHai a Yu, Jun a Wang, YunBo a Gao, JunXiong a

a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CURRENT DENSITY; DIELECTRIC LOSSES; FATIGUE OF MATERIALS; FERROELECTRICITY; LEAKAGE CURRENTS; MATHEMATICAL MODELS; MULTILAYERS; PERMITTIVITY; SEMICONDUCTING LEAD COMPOUNDS; SOL-GELS; SUBSTRATES;

LEAKAGE CURRENT DENSITY; MULTILAYER FERROELECTRIC THIN FILM; REMANENT POLARIZATION;

FERROELECTRIC THIN FILMS;

EID: 33646808084 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-006-8226-0 Document Type: Article

Times cited : (20)

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